For the evaluation of ion migration under constant temperature and humidity

This test device is used to evaluate the period of time until a short circuit occurs between conductors due to ion migration by applying a DC voltage to interdigital array electrodes under constant temperature and ambient humidity.

Testing equipment which reproduces the temperature profile of Reflow oven.

This equipment reproduces the environment by assuming the thermal stress which occurs when SMDs such as an image sensor package are mounted on a PCB, etc.

Equipped with a CCD camera, the equipment is able to monitor the change in materials during the reflow process on a real time basis.

Forecasting lifespans of materials under certain indoor and outdoor environmental conditions

By artificially reproducing certain indoor and outdoor environmental conditions such as sunlight, temperature, humidity, etc., the degradation of products or materials is accelerated and their lifespans can be forecasted.